Holographic interferometry method for determination of layer piezostack parameters

Authors

  • L. Patašienė
  • R. Vasiliauskas
  • A. Fedaravičius

Keywords:

piezomaterial, mechatronics systems, holographic interferometry, layer piezostack.

Abstract

Complex piezomaterials are frequently used in various mechtronics systems. The piezomaterial used in layer piezostack requiring high precision displacements have indicated that accuracy depends on design and technological factors. The analyzed criteria have made possible to choose the piezomaterial of an optimal mechatronic systems having a maximum displacement. The experimental investigation of precision vibrosystems by means of holographic interferometry enables one to obtain appreciably larger amounts of information about the vibrating surface in comparison with traditional methods. On the basis of the developed methodology of analyzing the experimental data derived from the holographic interferometry and by using the experimental holography stand, we have obtained results making it possible to optimize the design of operation of the mechatronic system or its separate elements.

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Published

2007-03-15

Issue

Section

ULTRASONIC AND ACOUSTIC MEASUREMENTS